Field emission SEM with EDX; also includes Electron Backscatter Diffraction for crystallographic texture mapping and an accessory for high temperature SEM studies
原子力显微镜
表面形貌和粗糙度
包括磁力显微镜探头
光学显微镜
功能包括断口分析，以确定失效机制
电子探针
用于定量化学分析的多光谱波长色散光谱仪
光学干涉法
表面形貌和粗糙度
x射线衍射(XRD)
室温粉末XRD晶相鉴定
High temperature XRD up to ~1500 °C in controlled atmosphere to monitor phase formation and evolution; can be used to trace reaction kinetics
Furnace for measuring surface tension and density of melts by the pendant drop and sessile drop methods; capable of controlled atmosphere and temperature up to 1400 °C
Thermogravimetric analysis (TGA) for measuring mass change as a function of temperature under controlled; can be linked to dehydration or dehydroxylation, 分解, 非化学计量性, 等.
测量热膨胀系数的膨胀法, 玻璃软化点, 烧结概要文件, 等.
即将推出的功能包括与质谱仪连接的TGA，用于分析演化气体和激光闪光热扩散率
电气性能测试
直流电导率作为温度的函数
Impedance spectroscopy (controlled atmosphere and controlled temperature up to 1000 °C); multiple uses include AC conductivity measurements and corrosion testing.
Thermoelectric power measurement; Seebeck coefficient measurement
测量电容、电感、电阻、阻抗、介电常数、损耗因数等.，在受控温度下
用标量法和阻抗圆法对压电进行表征
Measurement of strain and polarization as a function of applied field at temperatures between 20 °C to 280 °C at low frequencies; GHz frequencies for room temperature
控制温度下的霍尔效应测量
低温测量能力低至15K
高温熔体导电性
力学性能测试
多个英斯特朗通用测试框架，带夹具，用于拉伸测试, 压缩测试, 弯曲测试, 等.
硬度压痕
弹性模量的超声测量
环境al chamber for testing at controlled temperature (-34 °C to 190 °C) and controlled humidity (10% to 95% RH); upcoming capabilities include a chamber for high temperature testing
